4D-STEM (Scanning Transmission Electron Microscopy)
Sector - Automobile | Field - Mechanical
Test Description
4D-STEM is a powerful imaging technique that combines scanning transmission electron microscopy (STEM) with electron diffraction. By scanning a focused electron beam across a thin specimen and collecting the diffracted electrons, 4D-STEM can provide detailed information about the crystal structure, orientation, and strain distribution within the material.
Price : ¥1,000 to ¥10,000
Per sample time :from several hours to a few days
Daily machine operation :Typically 8-12 hours.
Test Procedure
- 1. Sample Preparation
- 2. Sample Loading
- 3. Imaging
- 4. Data Acquisition
- 5. Data Analysis
- 6. Additional Analysis
Applications
- 1. Materials science
- 2. Physics
- 3. Electronics
- 4. Biology
Frequently Asked Questions
What is the difference between 4D-STEM and conventional TEM?
4D-STEM combines STEM with electron diffraction, allowing it to provide more detailed information about the crystal structure, orientation, and strain distribution within a material. Conventional TEM primarily provides images of the material's structure.
How is the four-dimensional data collected in 4D-STEM?
The four-dimensional data is collected by scanning the electron beam across the sample and simultaneously measuring the intensity of the diffracted electrons as a function of electron beam position and diffraction angle.
What are the challenges associated with 4D-STEM data analysis?
Analyzing 4D-STEM data can be computationally intensive, especially for large datasets. Additionally, interpreting the data requires specialized knowledge and software.
Can 4D-STEM be used to study dynamic processes in materials?
Yes, 4D-STEM can be used to study dynamic processes in materials, such as phase transitions or the motion of defects. However, this requires specialized techniques and equipment to capture the rapid changes in the material's structure.
What are the limitations of 4D-STEM?
4D-STEM is limited by the thickness of the sample and the electron beam's energy. Thick samples can scatter electrons, reducing image contrast and resolution. High-energy electron beams can damage the sample, especially sensitive materials like biological specimens. Additionally, 4D-STEM can be a time-consuming and expensive technique.